IWJT2018
Mar.8- 9, 2018 Shanghai, China
18th International Workshop on Junction Technology
Fudan University
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The
following papers have signed the IEEE electronic copyright transfer
agreement online.
(20180228)
AUTHORS |
ARTICLE TITLE |
SIGNATURE |
SIGNATURE DATE |
Jun Luo, Shujuan Mao, Jing Xu, Guilei Wang, Dan
Zhang, Xue Luo, Ningyuan Duan, Shi Liu, Wenwu Wang, Dapeng Chen,
Junfeng Li, Chao Zhao, Tianchun Ye |
On the manifestation of Ge Pre-amorphization
Implantation (PAI) Impact on Both the Formation of Ultrathin TiSix
and the Specific Contact Resistivity in TiSix/n-Si Contacts for
sub-16/14 nm nodes and beyond |
Jun Luo |
25-02-2018 |
Wenmao Li, Jian Zhang, Robert Sokolovskij, Yumeng
Zhu, Yongle Qi, Xinpeng Lin, Jingyi Wu, Lingli Jiang, Hongyu Yu |
Au-based and Au-free Ohmic Contacts to AlGaN/GaN
Structures on Silicon or Sapphire Substrates |
YU HongYu |
24-02-2018 |
J. Wan, JN. Deng, XY. Cao, H. B. Liu, B. R. Lu, Y. F.
Chen, A. Zaslavsky, S. Cristoloveanu and M. Bawedin |
Novel photodetector based on FD-SOI substrate with
interface coupling effect |
jing wan |
24-02-2018 |
X. Y. Cao, HB.Liu, JN.Deng, WS.Lin,and J. Wan |
Photodetector Based on Silicon-on-Insulator with High
Responsivity |
Jing Wan |
24-02-2018 |
Man-Li Zhao, Hong-Liang Lu, Yu-Ming Zhang, Yi-Men
Zhang, Xiao-Hong Zhao |
Effect of Deep Level Traps on the I-V and C-V
Characteristics of InP/InGaAs Heterojunction |
Man-Li Zhao |
23-02-2018 |
Kazuo Tsutsui, Tomohiro Matsushita, Takayuki Muro,
Yoshitada Morikawa, Kotaro Natori, Takuya Hoshii, Kuniyuki
Kakushima, Hitoshi Wakabayashi, Kouichi Hayashi, Fumihiko Matsui,
and Toyohiko Kinoshita |
Analyses of 3D Atomic Arrangements of Impurity Atoms
Doped in Silicon by Spectro-Photoelectron Holography Technique |
Kazuo Tsutsui |
23-02-2018 |
Kenji Araki, Kan-Hua Lee, and Masafumi Yamaguchi, |
Opportunities for breaking an energy generation limit
of photovoltaic using multijunction and super-multijunction cells |
Kenji Araki |
23-02-2018 |
J. N. Nxumalo, Y.Y. Wang, M. Iwatake, C. Molella, A.
Katnani, J. Orcutt, J. Ayala, K. Nummy |
Characterizing Junction Profiles in Ge Photodetectors
using Scanning Capacitance Microscopy (SCM) and Electron Holography |
Jochonia N. Nxumalo |
23-02-2018 |
Paul J. Timans |
Activation Trends in Millisecond Annealing of Heavy
n-Type Doping of Silicon |
Johannes Keppler |
23-02-2018 |
Y.Y. Wang , J. Nxumalo, D. Ioannou, A. Katnani, J.
Jeon, K. Bandy, M. Mcdonald, J. Bruley |
Junction profiling on hot carrier stressed device by
dual lens electron holography and scanning capacitance microscopy |
Yun-Yu Wang |
23-02-2018 |
Philippe Rodriguez, Elodie Ghegin, and Fabrice
Nemouchi |
CMOS-Compatible Contact Technology for Si Photonics |
Rodriguez |
23-02-2018 |
Weijun Wan, Wei Ren, Xiaoran Meng, Yunxia Ping, Xing
Wei, Zhongying Xue, Wenjie Yu, Miao Zhang, Zengfeng Di, Bo Zhang |
Effect of platinum interlayer on the thermal
stability improvement of nickel stanogermanide |
Bo Zhang |
23-02-2018 |
Bodo Kalkofen, Mindaugas Šilinskas, Marco Lisker, Y.
S. Kim, and Edmund P. Burte |
Atomic layer deposited solid sources for doping of
high aspect ratio semiconductor structures |
Bodo Kalkofen |
23-02-2018 |
Yi Zhang, Genquan Han, Jiabo Chen, Yan Liu, Jincheng
Zhang, and Yue Hao |
Improved thermal stability of Al/TiO2/n-Ge ohmic
contact by inserting single layer graphene |
Genquan Han |
23-02-2018 |
Qianlan Hu, Sichao Li, Tiaoyang Li, Xin Wang, and
Yanqing Wu |
Optimized transport properties of GaN MISHEMTs with
thin AlN interlayer |
Yanqing WU |
23-02-2018 |
Mingqiang Huang, Xiong Xiong and Yanqing Wu |
High-performance heterojunctions based on 2D
semiconductors |
Yanqing Wu |
23-02-2018 |
Nur Nadhirah Rashid, Umar Abdul Aziz, Siti Rahmah
Aid, Suwa Akira, Hiroshi Ikenoue, Fang Xie and Anthony Centeno |
Effect of Stress on Activation during the Formation
of np Junction in Co-Implanted Germanium |
nur nadhirah binti mohamad rashid |
22-02-2018 |
Hao Yu, Marc Schaekers, Soon Aik Chew, Jean-Luc
Everaert, Ashish Dabral, Geoffrey Pourtois, Naoto Horiguchi, Dan
Mocuta, Nadine Collaert, Kristin De Meyer |
Titanium (Germano-)Silicides Featuring 10-9 Ω∙cm2
Contact Resistivity and Improved Compatibility to Advanced CMOS
Technology |
Hao Yu |
22-02-2018 |
Hiroshi Iwai |
Impact of the end of CMOS miniaturization on ICT and
the world after that |
Hiroshi Iwai |
22-02-2018 |
TongYang, Hong-liang Lu, Chen Liu, Wei-jian Yu,
Yu-ming Zhang, Yi-men Zhang |
The effect of ZnO Interface Passivation Layer on
Leakage Current Mechanisms and Band Alignment for ZrO2/In0.2Ga0.8As
Metal Oxide Semiconductor Capacitor |
tongyang |
22-02-2018 |
H. Hanafusa and S. Higashi |
Activation of High-temperature-implanted Phosphorus
Atoms in 4H-SiC by Atmospheric Pressure Thermal Plasma Jet Annealing |
Hiroaki HANAFUSA |
22-02-2018 |
Yiqiang Zhan |
Interfacial passivation by LiF or PbF2 for high
efficiency perovskite solar cell |
yiqiang zhan |
22-02-2018 |
Shu Qin |
H2 PLAD Hydrogenation Process on 3D NAND Array
Poly-Si Access Devices |
Shu Qin |
22-02-2018 |
Xicheng Duan, Peng Lu, Weicong Li, Jason C.S. Woo |
Parasitic Resistance Modeling and Optimization for
10nm-node FinFET |
Xicheng Duan |
22-02-2018 |
Yuanhui Fang, Jian Zhang, and Yu-Long Jiang |
Highly Selective Etch of Silicon Dioxide with
Tungsten Hard Mask Deposited by PVD Process |
yulong jiang |
22-02-2018 |
Hang Li, Yuanzhong Zhou, Meng Miao, Javier A.
Salcedo, Jean-Jacques Hajjar, and Kalpathy B. Sundaram |
Thermal Failure and Voltage Overshoot Models for
Diode Behavior under Electrostatic Discharge Stresses |
HANG LI |
22-02-2018 |
S. Boninelli, and F. Cristiano |
Damage recovery and strain induced by Phosphorous in
Laser Annealed Ge |
Simona Boninelli |
22-02-2018 |
Ray Duffy, Noel Kennedy, Gioele Mirabelli, Emmanuele
Galluccio, Paul K. Hurley, Justin D. Holmes, and Brenda Long |
Monolayer doping and other strategies in high
surface-to-volume ratio silicon devices |
Ray Duffy |
22-02-2018 |
Chuck Paeng, He Zhang, Bodo Kalkofen, and YS Kim |
Enhancing Phosphorous Doping Level on Ge by Sb
co-Doping with Non-Beamline Implantation Methods |
yunsang kim |
22-02-2018 |
D. Buca, C. Schulte-Braucks, N. von den Driesch, A.
T. Tiedemann, U. Breuer, J.M. Hartmann, P. Zaumseil, S. Mantl and
Q.T. Zhao |
Gate stack and Ni(SiGeSn) metal contacts formation on
low bandgap strained (Si)Ge(Sn) semiconductors |
Dan Buca |
22-02-2018 |
note/Invited
paper submission |