| IWJT2018  
      Mar.8- 9, 2018 Shanghai, China 
		18th International Workshop on Junction TechnologyFudan University
 
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	not accept a simple abstract.      The 
	following papers have signed the IEEE electronic copyright transfer 
	agreement online. (20180228) 
	   
		
			| 
			
			AUTHORS | 
			
			ARTICLE TITLE | 
			
			SIGNATURE | 
			
			SIGNATURE DATE |  
			| 
			
			Jun Luo, Shujuan Mao, Jing Xu, Guilei Wang, Dan 
			Zhang, Xue Luo, Ningyuan Duan, Shi Liu, Wenwu Wang, Dapeng Chen, 
			Junfeng Li, Chao Zhao, Tianchun Ye | 
			
			On the manifestation of Ge Pre-amorphization 
			Implantation (PAI) Impact on Both the Formation of Ultrathin TiSix 
			and the Specific Contact Resistivity in TiSix/n-Si Contacts for 
			sub-16/14 nm nodes and beyond | 
			
			Jun Luo | 
			
			25-02-2018 |  
			| 
			
			Wenmao Li, Jian Zhang, Robert Sokolovskij, Yumeng 
			Zhu, Yongle Qi, Xinpeng Lin, Jingyi Wu, Lingli Jiang, Hongyu Yu | 
			
			Au-based and Au-free Ohmic Contacts to AlGaN/GaN 
			Structures on Silicon or Sapphire Substrates | 
			
			YU HongYu | 
			
			24-02-2018 |  
			| 
			
			J. Wan, JN. Deng, XY. Cao, H. B. Liu, B. R. Lu, Y. F. 
			Chen, A. Zaslavsky, S. Cristoloveanu and M. Bawedin | 
			
			Novel photodetector based on FD-SOI substrate with 
			interface coupling effect | 
			
			jing wan | 
			
			24-02-2018 |  
			| 
			
			X. Y. Cao, HB.Liu, JN.Deng, WS.Lin,and J. Wan | 
			
			Photodetector Based on Silicon-on-Insulator with High 
			Responsivity | 
			
			Jing Wan | 
			
			24-02-2018 |  
			| 
			
			Man-Li Zhao, Hong-Liang Lu, Yu-Ming Zhang, Yi-Men 
			Zhang, Xiao-Hong Zhao | 
			
			Effect of Deep Level Traps on the I-V and C-V 
			Characteristics of InP/InGaAs Heterojunction | 
			
			Man-Li Zhao | 
			
			23-02-2018 |  
			| 
			
			Kazuo Tsutsui, Tomohiro Matsushita, Takayuki Muro, 
			Yoshitada Morikawa, Kotaro Natori, Takuya Hoshii, Kuniyuki 
			Kakushima, Hitoshi Wakabayashi, Kouichi Hayashi, Fumihiko Matsui, 
			and Toyohiko Kinoshita | 
			
			Analyses of 3D Atomic Arrangements of Impurity Atoms 
			Doped in Silicon by Spectro-Photoelectron Holography Technique | 
			
			Kazuo Tsutsui | 
			
			23-02-2018 |  
			| 
			
			Kenji Araki, Kan-Hua Lee, and Masafumi Yamaguchi, | 
			
			Opportunities for breaking an energy generation limit 
			of photovoltaic using multijunction and super-multijunction cells | 
			
			Kenji Araki | 
			
			23-02-2018 |  
			| 
			
			J. N. Nxumalo, Y.Y. Wang, M. Iwatake, C. Molella, A. 
			Katnani, J. Orcutt, J. Ayala, K. Nummy | 
			
			Characterizing Junction Profiles in Ge Photodetectors 
			using Scanning Capacitance Microscopy (SCM) and Electron Holography | 
			
			Jochonia N. Nxumalo | 
			
			23-02-2018 |  
			| 
			
			Paul J. Timans | 
			
			Activation Trends in Millisecond Annealing of Heavy 
			n-Type Doping of Silicon | 
			
			Johannes Keppler | 
			
			23-02-2018 |  
			| 
			
			Y.Y. Wang , J. Nxumalo, D. Ioannou, A. Katnani, J. 
			Jeon, K. Bandy, M. Mcdonald, J. Bruley | 
			
			Junction profiling on hot carrier stressed device by 
			dual lens electron holography and scanning capacitance microscopy | 
			
			Yun-Yu Wang | 
			
			23-02-2018 |  
			| 
			
			Philippe Rodriguez, Elodie Ghegin, and Fabrice 
			Nemouchi | 
			
			CMOS-Compatible Contact Technology for Si Photonics | 
			
			Rodriguez | 
			
			23-02-2018 |  
			| 
			
			Weijun Wan, Wei Ren, Xiaoran Meng, Yunxia Ping, Xing 
			Wei, Zhongying Xue, Wenjie Yu, Miao Zhang, Zengfeng Di, Bo Zhang | 
			
			Effect of platinum interlayer on the thermal 
			stability improvement of nickel stanogermanide | 
			
			Bo Zhang | 
			
			23-02-2018 |  
			| 
			
			Bodo Kalkofen, Mindaugas Šilinskas, Marco Lisker, Y. 
			S. Kim, and Edmund P. Burte | 
			
			Atomic layer deposited solid sources for doping of 
			high aspect ratio semiconductor structures | 
			
			Bodo Kalkofen | 
			
			23-02-2018 |  
			| 
			
			Yi Zhang, Genquan Han, Jiabo Chen, Yan Liu, Jincheng 
			Zhang, and Yue Hao | 
			
			Improved thermal stability of Al/TiO2/n-Ge ohmic 
			contact by inserting single layer graphene | 
			
			Genquan Han | 
			
			23-02-2018 |  
			| 
			
			Qianlan Hu, Sichao Li, Tiaoyang Li, Xin Wang, and 
			Yanqing Wu | 
			
			Optimized transport properties of GaN MISHEMTs with 
			thin AlN interlayer | 
			
			Yanqing WU | 
			
			23-02-2018 |  
			| 
			
			Mingqiang Huang, Xiong Xiong and Yanqing Wu | 
			
			High-performance heterojunctions based on 2D 
			semiconductors | 
			
			Yanqing Wu | 
			
			23-02-2018 |  
			| 
			
			Nur Nadhirah Rashid, Umar Abdul Aziz, Siti Rahmah 
			Aid, Suwa Akira, Hiroshi Ikenoue, Fang Xie and Anthony Centeno | 
			
			Effect of Stress on Activation during the Formation 
			of np Junction in Co-Implanted Germanium | 
			
			nur nadhirah binti mohamad rashid | 
			
			22-02-2018 |  
			| 
			
			Hao Yu, Marc Schaekers, Soon Aik Chew, Jean-Luc 
			Everaert, Ashish Dabral, Geoffrey Pourtois, Naoto Horiguchi, Dan 
			Mocuta, Nadine Collaert, Kristin De Meyer | 
			
			Titanium (Germano-)Silicides Featuring 10-9 Ω∙cm2 
			Contact Resistivity and Improved Compatibility to Advanced CMOS 
			Technology | 
			
			Hao Yu | 
			
			22-02-2018 |  
			| 
			
			Hiroshi Iwai | 
			
			Impact of the end of CMOS miniaturization on ICT and 
			the world after that | 
			
			Hiroshi Iwai | 
			
			22-02-2018 |  
			| 
			
			TongYang, Hong-liang Lu, Chen Liu, Wei-jian Yu, 
			Yu-ming Zhang, Yi-men Zhang | 
			
			The effect of ZnO Interface Passivation Layer on 
			Leakage Current Mechanisms and Band Alignment for ZrO2/In0.2Ga0.8As 
			Metal Oxide Semiconductor Capacitor | 
			
			tongyang | 
			
			22-02-2018 |  
			| 
			
			H. Hanafusa and S. Higashi | 
			
			Activation of High-temperature-implanted Phosphorus 
			Atoms in 4H-SiC by Atmospheric Pressure Thermal Plasma Jet Annealing | 
			
			Hiroaki HANAFUSA | 
			
			22-02-2018 |  
			| 
			
			Yiqiang Zhan | 
			
			Interfacial passivation by LiF or PbF2 for high 
			efficiency perovskite solar cell | 
			
			yiqiang zhan | 
			
			22-02-2018 |  
			| 
			
			Shu Qin | 
			
			H2 PLAD Hydrogenation Process on 3D NAND Array 
			Poly-Si Access Devices | 
			
			Shu Qin | 
			
			22-02-2018 |  
			| 
			
			Xicheng Duan, Peng Lu, Weicong Li, Jason C.S. Woo | 
			
			Parasitic Resistance Modeling and Optimization for 
			10nm-node FinFET | 
			
			Xicheng Duan | 
			
			22-02-2018 |  
			| 
			
			Yuanhui Fang, Jian Zhang, and Yu-Long Jiang | 
			
			Highly Selective Etch of Silicon Dioxide with 
			Tungsten Hard Mask Deposited by PVD Process | 
			
			yulong jiang | 
			
			22-02-2018 |  
			| 
			
			Hang Li, Yuanzhong Zhou, Meng Miao, Javier A. 
			Salcedo, Jean-Jacques Hajjar, and Kalpathy B. Sundaram | 
			
			Thermal Failure and Voltage Overshoot Models for 
			Diode Behavior under Electrostatic Discharge Stresses | 
			
			HANG LI | 
			
			22-02-2018 |  
			| 
			
			S. Boninelli, and F. Cristiano | 
			
			Damage recovery and strain induced by Phosphorous in 
			Laser Annealed Ge | 
			
			Simona Boninelli | 
			
			22-02-2018 |  
			| 
			
			Ray Duffy, Noel Kennedy, Gioele Mirabelli, Emmanuele 
			Galluccio, Paul K. Hurley, Justin D. Holmes, and Brenda Long | 
			
			Monolayer doping and other strategies in high 
			surface-to-volume ratio silicon devices | 
			
			Ray Duffy | 
			
			22-02-2018 |  
			| 
			
			Chuck Paeng, He Zhang, Bodo Kalkofen, and YS Kim | 
			
			Enhancing Phosphorous Doping Level on Ge by Sb 
			co-Doping with Non-Beamline Implantation Methods | 
			
			yunsang kim | 
			
			22-02-2018 |  
			| 
			
			D. Buca, C. Schulte-Braucks, N. von den Driesch, A. 
			T. Tiedemann, U. Breuer, J.M. Hartmann, P. Zaumseil, S. Mantl and 
			Q.T. Zhao | 
			
			Gate stack and Ni(SiGeSn) metal contacts formation on 
			low bandgap strained (Si)Ge(Sn) semiconductors | 
			
			 Dan Buca | 
			
			22-02-2018 |    
	
	note/Invited 
	paper submission |